Temperature sensitivity modeling of pn-junction diodes for microbolometer-based thermal imaging applications

Autor: Shen Hue Sun, Joachim N. Burghartz, Daniel B. Etter, Ingo Herrmann, Fabian Utermohlen
Rok vydání: 2013
Předmět:
Zdroj: 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG).
Popis: A model for the electrical behavior of pn-junction diodes biased in forward direction and used as a temperature sensitive device (TSD) in microbolometers is presented. It is based on the well-known Shockley equation extended by the ideality factor m. We demonstrate that the largest temperature sensitivity can be reached for diodes at low current density operation featuring a high ideality factor m > 1.
Databáze: OpenAIRE