Stimulated crystallization of thermal silica films. i. heat treatment
Autor: | V. V. Khatko, N. V. Rumak |
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Rok vydání: | 1986 |
Předmět: | |
Zdroj: | physica status solidi (a). 95:391-395 |
ISSN: | 1521-396X 0031-8965 |
DOI: | 10.1002/pssa.2210950204 |
Popis: | The interdependence is studied between the changing state of a solid solution of homogeneous structure in submicropores and the value of a fixed charge in thermal films of silica subjected to annealing. The results obtained support the conclusion about the predominant contribution of SiO2phase-structural transformations to the formation of charge properties of the system SiSiO2 and enable one to judge about the mechanisms of these transformations. [Russian Text Ignored]. |
Databáze: | OpenAIRE |
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