Autor: |
J. Ivanco, Sergiu Pop, Heinz-Georg Flesch, Ingo Salzmann, Alfred Neuhold, Dietrich R. T. Zahn, Martin Oehzelt, Teodor Toader, Roland Resel, Detlef-Matthias Smilgies, Armin Moser |
Rok vydání: |
2013 |
Předmět: |
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Zdroj: |
Chemical Physics Letters. 574:51-55 |
ISSN: |
0009-2614 |
DOI: |
10.1016/j.cplett.2013.04.053 |
Popis: |
This Letter reports the impact of the evaporation rate on the crystallographic phase formation of vacuum deposited α-sexithiophene thin films studied by X-ray diffraction methods. The experiments reveal the formation of two crystal phases, one of which is a thermodynamically stable phase occurring at low rates, while the second is favored by high rates. This second phase exhibits an increased layer spacing and diffraction features typical for two-dimensional crystals which are laterally ordered but without interlayer correlations of the molecular positions. This disordered layered phase comprises molecules of nonuniform conformations, and is kinetically induced. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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