RBS and XFA analysis of polyimide films from the Mir space station

Autor:	V. P. Petukhov, T. N. Smirnova, N. G. Aleksandrov, P. N. Chernykh, V. S. Kulikauskas, Yu. O. Bakhvalov, V. N. Chernik, Lev Novikov, V. V. Zatekin
Rok vydání:	2008
Předmět:	Orbital space Elemental composition Materials science Silicon Spacecraft business.industry Analytical chemistry chemistry.chemical_element Space (mathematics) Surfaces Coatings and Films chemistry Optoelectronics Thin film business Polyimide Space environment
Zdroj:	Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 2:282-285
ISSN:	1819-7094 1027-4510
DOI:	10.1134/s1027451008020225
Popis:	The elemental composition of polyimide film contamination was studied by the RBS and XFA methods. The films were exposed to the space environment aboard the Mir orbital space station during the KOMPLAST in-flight experiment. It was shown that the prevalent deposit element was silicon, which agrees with measurements performed on other spacecrafts.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d5791574ad8ef8e81a6ba20e47ae75bd https://doi.org/10.1134/s1027451008020225 Zobrazit plný text záznamu Full text from SpringerLink