Estimation of Local Deterioration Factor in Crystalline Si PV Module by Partial Shading
| Autor: | Tanase, T., Takahashi, Y., Fujiwara, K. |
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| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: | |
| DOI: | 10.4229/eupvsec20172017-5bv.4.24 |
| Popis: | 33rd European Photovoltaic Solar Energy Conference and Exhibition; 1597-1601 Accurately diagnosing failures of a photovoltaic (PV) module is important for improving its reliability. In this paper, the authors investigate a method to diagnose faults of a crystalline silicon PV module from its currentvoltage (I-V) curves. Specifically, the authors try to detect the failure PV cell by shading one PV cell in the PV module and measuring the I-V curve of the PV module. As a result, local deterioration caused by shunt resistance can be detected. Furthermore, based on the fact that the influence of deterioration due to the shunt resistance does not appear near the open-circuit voltage in the PV cell's I-V characteristic, the authors propose the method to extract the IV characteristic of the deteriorated PV cell from the PV module’s I-V characteristic. As a result, it is confirmed that the extracted and measured I-V curve of the deteriorated PV cell agrees well. |
| Databáze: | OpenAIRE |
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