Effects of Storage Conditions on Imprint Characteristics in SrBi2Ta2O9Capacitors

Autor:	Takao Kanehara, Koji Takaya, Ichiro Koiwa, Kinya Ashikaga, Yoshiki Nagatomo
Rok vydání:	2006
Předmět:	Capacitor Acceleration Hysteresis Materials science Physics and Astronomy (miscellaneous) business.industry law Electrode General Engineering General Physics and Astronomy Optoelectronics business law.invention
Zdroj:	Japanese Journal of Applied Physics. 45:7294-7299
ISSN:	1347-4065 0021-4922
Popis:	The effects on the imprint characteristics of SrBi2Ta2O9 capacitors of various storage conditions were investigated. It was observed that the hysteresis shifts due to imprint degradations were smaller in the case in which the both electrodes of the capacitors were connected after increasing the temperature of the capacitors that were polarized at room temperature than in the case in which the electrodes were not connected. The acceleration ratio (Racc) of the slope of the hysteresis shift in the capacitors without connected electrodes to that with connected electrodes is 1.35 at 125 °C in device-size capacitors, and the ratio is much less dependent on temperature than the hysteresis shift. Moreover, it was also found that Racc was smaller in the case in which the process-induced damage located near the interfaces was larger.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d5186d4bb0c7da0835ae257f858be7d1 https://doi.org/10.1143/jjap.45.7294 Zobrazit plný text záznamu