Monitoring Fast Thermal Dynamics at the Nanoscale through Frequency Domain Photoinduced Force Microscopy
| Autor: | Eun Seong Lee, Abid Anjum Sifat, Junghoon Jahng, Bongsu Kim, Eric O. Potma |
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| Rok vydání: | 2021 |
| Předmět: |
Materials science
business.industry 02 engineering and technology Thermal dynamics 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Sample (graphics) Thermal expansion 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials General Energy Frequency domain Microscopy Optoelectronics Physical and Theoretical Chemistry 0210 nano-technology business Nanoscopic scale |
| Zdroj: | The Journal of Physical Chemistry C. 125:7276-7286 |
| ISSN: | 1932-7455 1932-7447 |
| DOI: | 10.1021/acs.jpcc.1c00874 |
| Popis: | In illuminated tip–sample junctions, the absorption of light by the sample is accompanied by local heating and subsequent thermal expansion of the material. In photoinduced force microscopy (PiFM) ... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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