Failures of Ag Wire Bonding ICs in Real-world Applications

Autor: Xuanlong Chen, Xiaping Xie, Min Wang, Yongjia Ruan, Tianhan Liu, Lin Shi
Rok vydání: 2022
Zdroj: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
DOI: 10.1109/ipfa55383.2022.9915707
Databáze: OpenAIRE