Failures of Ag Wire Bonding ICs in Real-world Applications
Autor: | Xuanlong Chen, Xiaping Xie, Min Wang, Yongjia Ruan, Tianhan Liu, Lin Shi |
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Rok vydání: | 2022 |
Zdroj: | 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). |
DOI: | 10.1109/ipfa55383.2022.9915707 |
Databáze: | OpenAIRE |
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