Soft Error Tolerance of Power-Supply-Noise Hardened Latches
| Autor: | Yuya Kinoshita, Yukiya Miura |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
Very-large-scale integration
Computer science 020208 electrical & electronic engineering Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology Noise (electronics) 020202 computer hardware & architecture Power (physics) Ground level Power supply voltage Reliability (semiconductor) Soft error Hardware_INTEGRATEDCIRCUITS 0202 electrical engineering electronic engineering information engineering Electronic engineering Hardware_LOGICDESIGN Electronic circuit |
| Zdroj: | IOLTS |
| DOI: | 10.1109/iolts50870.2020.9159710 |
| Popis: | As the shrink of a device size and the decrease in power supply voltage of VLSI circuits, their reliability has been degraded due to soft errors. In recent years, malfunctions caused by soft errors have become noticeable on the ground level, and their countermeasures are required. The authors have proposed power-supply-noise hardened FFs which have a partially redundant circuit structure. Focusing on the redundant structure of the latch circuits in those FFs, this paper evaluates their soft error tolerance. By using HSPICE circuit simulations, it is shown that the latch circuits are tolerant not only to power supply noise but also to soft errors. Finally, from those results, this paper shows that the proposed FFs have high reliability for these factors. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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