Monte-Carlo yield analysis [of Josephson circuits]
| Autor: | Q.P. Herr, M.W. Johnson, J.W. Sparge |
|---|---|
| Rok vydání: | 1999 |
| Předmět: |
Digital electronics
Josephson effect Yield (engineering) Computer science business.industry Gaussian Monte Carlo method Condensed Matter Physics Electronic Optical and Magnetic Materials symbols.namesake symbols Electronic engineering Electrical and Electronic Engineering business Importance sampling Electronic circuit Parametric statistics |
| Zdroj: | IEEE Transactions on Appiled Superconductivity. 9:3322-3325 |
| ISSN: | 1051-8223 |
| DOI: | 10.1109/77.783740 |
| Popis: | Speed, integration scale, and production cost of digital electronics are all constrained by circuit yield. This is true in any technology, In Josephson circuits, parameter variations figure prominently into the yield equation. Extensive statistical data exist for processes such as TRW's Nb and NbN technologies; yield calculation is a way to relate these data to circuit performance. To determine parametric yield using Monte Carlo, any and all circuit parameters are treated as Gaussian random variables. This kind of yield calculation has now been incorporated into the MALT optimization utility. As a worked example, we analyze a stacked SQUID amplifier design. The technique reveals circuit dynamics that are difficult to uncover by other means. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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