Collective spin behavior of NiGe thin films on MgO substrate
| Autor: | Adem Parabas, Bayram Kocaman, Fikret Yildiz, Sinan Kazan |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
010302 applied physics
Materials science Analytical chemistry Oxide 02 engineering and technology Substrate (electronics) 021001 nanoscience & nanotechnology Condensed Matter Physics Epitaxy Critical value 01 natural sciences Ferromagnetic resonance Electronic Optical and Magnetic Materials chemistry.chemical_compound chemistry 0103 physical sciences Thin film 0210 nano-technology Anisotropy Molecular beam epitaxy |
| Zdroj: | Journal of Magnetism and Magnetic Materials. 527:167722 |
| ISSN: | 0304-8853 |
| DOI: | 10.1016/j.jmmm.2020.167722 |
| Popis: | The results of the magnetic and structural properties of epitaxially grown NiGe thin films on (0 0 1) oriented MgO substrate by using molecular beam epitaxy (MBE) have been presented. The XRD measurements showed that the NiGe thin films grown on MgO substrate epitaxially with four-fould rotational crystalline symmetry. In addition, the measurements indicate that the NiGe films were grown on (1 1 0)-crystalliographic orientation with respect to (1 0 0) direction of the MgO substrate. It has been revealed that the saturation magnetization (Ms) decreases with increasing Ge concentration up to the critical value and then start to increases again at the rate of x = 0.14 in sample of Ni(1-x)Gex. With increasing of the relative Ge concentration, the structural and the magnetic properties of the films evolved into a new pahase with a critical structural order parameter. Also, ferromagnetic resonance measurements show that all magneto-crystalline anisotropy parameters are consistent with this structural critical order. We compared these results with our previous studies about the structural and magnetic properties of the NiGe thin films grown on native oxide Si (0 0 1) substrate. |
| Databáze: | OpenAIRE |
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