Layout-level Vulnerability Ranking from Electromagnetic Fault Injection

Autor:	Lang Lin, Jimin Wen, Harsh Shrivastav, Weike Li, Hua Chen, Gang Ni, Sreeja Chowdhury, Calvin Chow, Norman Chang
Rok vydání:	2022
Zdroj:	2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST).
DOI:	10.1109/host54066.2022.9840146
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d47e816dfa92bd4d42acc36d18f41b86 https://doi.org/10.1109/host54066.2022.9840146 Zobrazit plný text záznamu