A one-film-model ellipsometry program for the simultaneous calculation of protein film thickness and refractive index
| Autor: | Robert D. Sproull, Joseph McGuire, Viwat Krisdhasima |
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| Rok vydání: | 1992 |
| Předmět: |
Yield (engineering)
Computer program business.industry Chemistry Surfaces and Interfaces General Chemistry Condensed Matter Physics GeneralLiterature_MISCELLANEOUS Surfaces Coatings and Films Optics Software Ellipsometry Materials Chemistry business Refractive index ComputingMethodologies_COMPUTERGRAPHICS |
| Zdroj: | Surface and Interface Analysis. 18:453-456 |
| ISSN: | 1096-9918 0142-2421 |
| DOI: | 10.1002/sia.740180614 |
| Popis: | Heterogeneous protein films are not perfectly suited to ellipsometric analysis, and commercially available software often fails to yield meaningful optical properties for such films. Here, we describe a computer program uniquely suited for calculation of the thickness and refractive index of protein films. An important feature of the new program is an algorithm that allows a search for a solution in up to four directions. |
| Databáze: | OpenAIRE |
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