Atomic force microscopy with a conducting tip: correlation studies between microstructure and electrical properties of YBaCuO thin films
| Autor: | Pascal Chrétien, Alain J. Kreisler, E. Caristan, Annick F. Dégardin, L. Boyer, Olivier Schneegans, Frédéric Houzé, A. De Luca |
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| Rok vydání: | 2000 |
| Předmět: |
Materials science
Investigation methods Electrical transport Electrical resistivity and conductivity Atomic force microscopy Energy Engineering and Power Technology Electrical and Electronic Engineering Composite material Thin film Condensed Matter Physics Microstructure Electrical contacts Electronic Optical and Magnetic Materials |
| Zdroj: | Physica C: Superconductivity. :1965-1968 |
| ISSN: | 0921-4534 |
| DOI: | 10.1016/s0921-4534(00)01128-x |
| Popis: | Topographical and local electrical contact resistance images on surfaces of YBaCuO thin films sputtered onto MgO and SrTiO3 substrates have been obtained by AFM using a conducting tip. Typical growth exhibiting terraces of one unit cell height has been observed. Moreover, electrical images have clearly revealed electrically connected areas between grains, which can be correlated to electrical transport properties of the films. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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