Failure Analysis Techniques and Studies on Vertical Short Issue for Production Wafers
Autor: | Naiyun Xu, D. Nagalingam, R. Fransiscus, Siong Luong Ting, Pik Kee Tan, A. C. T. Quah, Htin Kyaw, H. H. W. Thoungh, C. Q. Chen, Yanlin Pan, Krishnanunni Menon, P.T. Ng, S. M. Parab, Hao Tan |
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Rok vydání: | 2021 |
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Zdroj: | 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). |
Databáze: | OpenAIRE |
Externí odkaz: |