Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies

Autor:	Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering
Zdroj:	Journal of Electronic Testing. 38:21-38
ISSN:	1573-0727 0923-8174
DOI:	10.1007/s10836-022-05988-y
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d34c9aaa7dbc991743fec0063d1d1b82 https://doi.org/10.1007/s10836-022-05988-y Zobrazit plný text záznamu Full text from SpringerLink