Lateral lattice coherence lengths in thin films of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical diffraction in monochromator crystals

Autor:	S. L. Morelhão, Kycia, Stefan W, Netzke, Samuel, Fornari, Celso Israel, P. H. O. Rappl, Abramof, Eduardo
Rok vydání:	2019
DOI:	10.13140/rg.2.2.22551.52644
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d2ecbd144e276436746706d5f2d213a0 Zobrazit plný text záznamu