| Autor: |
Jonathan Lees, D. Williams, James Bell, A. Patterson, Paul J. Tasker, W. Wohlmuth, M. Koh |
| Rok vydání: |
2013 |
| Předmět: |
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| Zdroj: |
2013 IEEE MTT-S International Microwave Symposium Digest (MTT). |
| DOI: |
10.1109/mwsym.2013.6697424 |
| Popis: |
This paper combines the advantages of accurate measurement based non-linear behavioral look-up table transistor models with passive embedding networks to develop a scalable large signal model. This approach provides for a more robust utilization of measurement based data models in X-band MMIC design by providing accurate performance predictions as a function of gate periphery and at power levels beyond the limitations of high frequency measurement systems. An example is provided where a 1 W Gallium Nitride reference device, characterized in Class B at 9 GHz, delivering over 70% efficiency, is used to accurately predict the behavior of devices with up to 5 times larger gate periphery. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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