Differential integrator pixel architecture for dark current compensation in CMOS image sensors
Autor: | Marzieh Mehri Dehnavi, Yves Audet, Elham Khamsehashari |
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Rok vydání: | 2016 |
Předmět: |
010302 applied physics
Physics CMOS sensor business.industry ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION Electrical engineering Differential amplifier 01 natural sciences Photodiode law.invention Op amp integrator CMOS law Integrator 0103 physical sciences Hardware_INTEGRATEDCIRCUITS Electronic engineering Image sensor business Dark current |
Zdroj: | NEWCAS |
DOI: | 10.1109/newcas.2016.7604824 |
Popis: | A dark current compensation technique for low-light image sensors is presented in this work. A multi-branch differential integrator circuit is proposed to compensate the effect of dark current in CMOS image sensors. In order to obtain a low level sensing application, a T-type switch with low leakage current is used. The new configuration of multiple-input multiple-output differential amplifier has the advantage of carefully managing the femto-ampere range dark currents of photodiode. The high-sensitivity active-pixel CMOS image sensor using a standard TSMC CMOS 0.18 µm fabrication process has been obtained. |
Databáze: | OpenAIRE |
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