IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER FOR PIXE

Autor:	Atsuro Tonomura, Kenichi Hasegawa, Kuniko Maeda, Hiromi Hamanaka
Rok vydání:	2001
Předmět:	Crystal Optics business.industry Position (vector) Chemistry Proportional counter Crystal spectrometer business Sample (graphics) Slit
Zdroj:	International Journal of PIXE. 11:35-44
ISSN:	1793-6616 0129-0835
Popis:	A narrow entrance slit was attached to an in-air high-resolution PIXE system composed of a flat analyzing crystal and a position-sensitive proportional counter. Chemical shift measurements were carried out for Si, P and S Kα1,2 lines from various sample targets. The precision of measurements is much improved compared with that obtained by the position-sensitive crystal spectrometer system without the entrance slit. The new system equipped with the entrance slit does not require exact sample positioning. It is applicable to non-flat targets. Chemical shift measurements are also possible while moving the targets.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d2224738060fc94ac039e8eaca90c0a6 https://doi.org/10.1142/s0129083501000062 Zobrazit plný text záznamu