IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER FOR PIXE
Autor: | Atsuro Tonomura, Kenichi Hasegawa, Kuniko Maeda, Hiromi Hamanaka |
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Rok vydání: | 2001 |
Předmět: | |
Zdroj: | International Journal of PIXE. 11:35-44 |
ISSN: | 1793-6616 0129-0835 |
Popis: | A narrow entrance slit was attached to an in-air high-resolution PIXE system composed of a flat analyzing crystal and a position-sensitive proportional counter. Chemical shift measurements were carried out for Si, P and S Kα1,2 lines from various sample targets. The precision of measurements is much improved compared with that obtained by the position-sensitive crystal spectrometer system without the entrance slit. The new system equipped with the entrance slit does not require exact sample positioning. It is applicable to non-flat targets. Chemical shift measurements are also possible while moving the targets. |
Databáze: | OpenAIRE |
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