Autor: |
L. Lever, N.J. Pilgrim, Kevin Gallacher, Phil Allred, Robert W. Kelsall, Gerald S. Buller, David R. Leadley, Ryan E. Warburton, Maksym Myronov, Douglas J. Paul, G. Intermite, Zoran Ikonic |
Rok vydání: |
2013 |
Předmět: |
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Zdroj: |
10th International Conference on Group IV Photonics. |
DOI: |
10.1109/group4.2013.6644406 |
Popis: |
Ge-on-Si single-photon detectors are fabricated and characterized at 1310 and 1550 nm. 4 % single-photon detection efficiency is observed at 1310 nm demonstrating the lowest reported noise equivalent power for Ge-on-Si single-photon detectors (1×10-14 WHz-1/2). |
Databáze: |
OpenAIRE |
Externí odkaz: |
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