| Popis: |
In order to evaluate the reliability guidelines for electronic equipment with high reliability and long life quickly, this paper presents the method of step-up-stress accelerated degradation testing. First expatiate step-up-stress accelerated degradation testing and the basic assumptions in detailed, then gives the data conversion method from step up stress degradation data to constant stress degradation data; At the basis, propose step up stress accelerated degradation reliability assessment arithmetic based on random degradation path; A numerical example was given to illustrate the method in the end. The testing method overcomes the shortages of constant degradation testing, which has higher testing efficiency. |
