Process-Induced Carbon Sub-Layer in Sic\Bn\Sic Composites: Characterization and Consequences

Autor:	L. U. J. T Ogbuji, D. R. Wheeler, T. R. McCue
Rok vydání:	2008
Předmět:	Materials science chemistry Composite number chemistry.chemical_element Composite material Elemental carbon Carbon Layer (electronics) Stoichiometry Characterization (materials science)
Zdroj:	25th Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A: Ceramic Engineering and Science Proceedings
DOI:	10.1002/9780470294680.ch45
Popis:	Following our detection of films of elemental carbon in the Hi-Nicalon TM/BN/SiC composite and its deleterious effect on oxidative durability, we have examined other SiC/BN/SiC systems. The problem is pervasive, and significant residues of free carbon are confirmed in Sylramic /BN/SiC materials. Effective techniques for routine detection and characterization of adventitious carbon in SiC/BN/SiC composites are discussed.
Databáze:	OpenAIRE
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