High-Frequency Characterization and Modeling of Low and High Voltage FinFETs for RF SoCs

Autor:	Yogesh S. Chauhan, Anirban Kar, Shivendra S. Parihar, Jun Z. Huang, Huilong Zhang, Weike Wang, Kimihiko Imura
Rok vydání:	2023
Zdroj:	2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d131961bff8cb7a015dc2552e7369ca7 https://doi.org/10.1109/edtm55494.2023.10103010 Zobrazit plný text záznamu