Correlation between barrier height and interface structure of Schottky diodes

Autor:	W. Mönch, R. F. Schmitsdorf, T. U. Kampen
Rok vydání:	1995
Předmět:	Materials science business.industry Interface (computing) Materials Chemistry Optoelectronics Richardson constant Schottky diode Surfaces and Interfaces Condensed Matter Physics business Surfaces Coatings and Films
Zdroj:	Surface Science. 324:249-256
ISSN:	0039-6028
DOI:	10.1016/0039-6028(94)00791-8
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d12508556e18eba5d13a44ae8e98f36f https://doi.org/10.1016/0039-6028(94)00791-8 Zobrazit plný text záznamu Full Text from ScienceDirect