| Popis: |
The fluctuation character of the field electron current in uranium-indium (U-In), tungsten-rhenium (W-Re) and niobium-germanium (Nb-Ge) film systems, was studied. In all cases, ϕ s (substrate-material work function) was less than ϕ f (film-material work function) and the coverage degree θ was in the range 1–10. Amplitude spectra of the fluctuations were obtained and analyzed. The shape and parameters of individual fluctuations resulting from low-energy gas ion bombardment, occurring in the space between the field emitter and the anode by the electron shock mechanism, were also obtained. It is shown that these spectra qualitatively reflect the film system degradation and make it possible to evaluate its lifetime. |
