Temperature influence compensation in microbolometer detector for image quality enhancement
| Autor: | Henryk Madura, Sławomir Gogler, Tomasz Sosnowski, Michal Krupinski |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Materials science
Pixel Physics::Instrumentation and Detectors business.industry Image quality 020208 electrical & electronic engineering 010401 analytical chemistry Detector Process (computing) Microbolometer 02 engineering and technology 01 natural sciences Signal 0104 chemical sciences Compensation (engineering) Optics Shutter 0202 electrical engineering electronic engineering information engineering High Energy Physics::Experiment business |
| Zdroj: | Proceedings of the 2016 International Conference on Quantitative InfraRed Thermography. |
| DOI: | 10.21611/qirt.2016.068 |
| Popis: | In the article a non-uniformity correction method is presented which allows to compensate for the influence of detector’s temperature drift. Presented method utilizes estimated dependency between output signal of detectors and their temperature. In the presented method, the dependency between output signal value and the temperature of the detector is estimated during time of starting detector. The coefficients are estimated for every pixel. Proposed method allows to compensate the influence of detectors temperature fluctuation and increase a time between shutter actuation process. Additional lenses coefficients allow to compensate ambient temperature fluctuation. |
| Databáze: | OpenAIRE |
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