Obtainment of textured films of aluminum nitride by thermochemical nitridation of sapphire

Autor: Kh. Sh-o. Kaltaev, N. S. Sidelnikova, M. A. Rom, M. V. Dobrotvorskaya, S. V. Nizhankovskiy, A. Y. Dan’ko, Pavel V. Mateychenko, A. T. Budnikov
Rok vydání: 2009
Předmět:
Zdroj: Semiconductors. 43:1606-1609
ISSN: 1090-6479
1063-7826
DOI: 10.1134/s1063782609120069
Popis: The possibility of obtaining textured aluminum nitride films by thermochemical nitridation of sapphire in the temperature range of 1200–1500°C in nitrogen atmosphere with the CO content from 0.1 to 5 vol % is shown. The diffusion mechanism of formation of the aluminum nitride film on the sapphire surface under the effect of the reducing medium is established.
Databáze: OpenAIRE