Obtainment of textured films of aluminum nitride by thermochemical nitridation of sapphire
Autor: | Kh. Sh-o. Kaltaev, N. S. Sidelnikova, M. A. Rom, M. V. Dobrotvorskaya, S. V. Nizhankovskiy, A. Y. Dan’ko, Pavel V. Mateychenko, A. T. Budnikov |
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Rok vydání: | 2009 |
Předmět: | |
Zdroj: | Semiconductors. 43:1606-1609 |
ISSN: | 1090-6479 1063-7826 |
DOI: | 10.1134/s1063782609120069 |
Popis: | The possibility of obtaining textured aluminum nitride films by thermochemical nitridation of sapphire in the temperature range of 1200–1500°C in nitrogen atmosphere with the CO content from 0.1 to 5 vol % is shown. The diffusion mechanism of formation of the aluminum nitride film on the sapphire surface under the effect of the reducing medium is established. |
Databáze: | OpenAIRE |
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