Energy-dispersive X-ray-absorption edge spectrometry with spectrum filtration by X-ray mirrors
Autor: | S. S. Gizha, V. M. Senkov, S. K. Savel’ev, A. G. Tur’yanskii |
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Rok vydání: | 2014 |
Předmět: | |
Zdroj: | Technical Physics Letters. 40:346-349 |
ISSN: | 1090-6533 1063-7850 |
Popis: | A highly sensitive energy-dispersive scheme with a semiconductor spectrometer is proposed for determining impurity concentrations from the X-ray-absorption edge spectra. The optimization of spectrum in a band studied is ensured by sequential reflections of transmitted radiation from X-ray mirrors and by variation of the grazing angle of the analyzed beam. Results of measurements of the X-ray-absorption edge spectra of Fe in dispersed salt samples and W impurity in beryllium plate are presented. It is shown that the problem of deconvolution can be numerically solved by smoothing X-ray-absorption fine-structure oscillations with power functions. |
Databáze: | OpenAIRE |
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