Characterization and Analyses of RadHard-By-Design CMOS Open Drain Quad Comparators

Autor:	Ray Benson, Randall Milanowski, James W. Swonger, Paul Resch
Rok vydání:	2014
Předmět:	Engineering Comparator CMOS business.industry Absorbed dose Open collector Spice Electronic engineering Cmos comparator Hardware_PERFORMANCEANDRELIABILITY Transient response Hardware_ARITHMETICANDLOGICSTRUCTURES business
Zdroj:	2014 IEEE Radiation Effects Data Workshop (REDW).
DOI:	10.1109/redw.2014.7004555
Popis:	We provide characterization data for Total Ionizing Dose and Single Event effects on a radiation hardened by design quad CMOS comparator. We also present selected results of SPICE simulation analyses of single event transient response.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d0cf3d0ce1a150a0146dd966e9ed4c5a https://doi.org/10.1109/redw.2014.7004555 Zobrazit plný text záznamu