Development of a 300 kV ultrahigh resolution analytical electron microscope
| Autor: | Kurio Fukushima, Yoshihiro Arai, Alain Michot, Yasushi Kokubo |
|---|---|
| Rok vydání: | 1990 |
| Předmět: |
Conventional transmission electron microscope
Materials science Scanning electron microscope business.industry Analytical electron microscope law.invention Optics Ultrahigh resolution law Scanning transmission electron microscopy Electron microscope Electron beam-induced deposition business Instrumentation Environmental scanning electron microscope |
| Zdroj: | Microscopy Microanalysis Microstructures. 1:233-240 |
| ISSN: | 1154-2799 |
| DOI: | 10.1051/mmm:0199000103023300 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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