Rapid computer-controlled capacitance transient characterization of deep-level centers

Autor:	A. Marshall, H. G. Maguire
Rok vydání:	1986
Předmět:	Materials science Deep-level transient spectroscopy Spectrometer Computer program Fast Fourier transform Redundancy (engineering) Electronic engineering Activation energy Electrical and Electronic Engineering Instrumentation Capacitance Arrhenius plot Computational physics
Zdroj:	IEEE Transactions on Instrumentation and Measurement. :313-317
ISSN:	1557-9662 0018-9456
DOI:	10.1109/tim.1986.6499216
Popis:	A computer-based deep-level capacitance transient spectrometer is described which was designed and constructed as a result of the inadequacy which was designed and constructed as a result of the inadequacy of commercially available deep-level transient spectrometers. Deep-level activation energies and trap concentrations are obtained in a single-temperature scan. Unlike conventional systems, which `contour' predetermined emission rates by viewing a rate window, giving only one point per level, thermal emission rates are directly determined. This retains more information and reduces the redundancy of conventional methods by obtaining all information necessary to construct an Arrhenius plot in a single-temperature ramp. The method requires fewer computer calculations compared with systems using fast Fourier analysis, and displays improved signal-to-noise ratios. Data is displayed in the form of an Arrhenius plot for level depth and capture cross section assessment, and a ΔC versus temperature graph provides information on trap concentrations.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d0a7a1cad9f5dffcf6dc6881ae662883 https://doi.org/10.1109/tim.1986.6499216 Zobrazit plný text záznamu