Electrical limit of silver nanowire electrodes: Direct measurement of the nanowire junction resistance
| Autor: | Christoph Sachse, David Kneppe, Karl Leo, Lars Müller-Meskamp, Aram Amassian, Nelli Weiß, Alexander Eychmüller, Carlo Floresca, Franz Selzer, Ludwig Bormann |
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| Rok vydání: | 2016 |
| Předmět: |
Materials science
Physics and Astronomy (miscellaneous) business.industry Annealing (metallurgy) Nanowire Nanotechnology 02 engineering and technology Silver nanowires Conductivity 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Electrical resistivity and conductivity Electrode Optoelectronics 0210 nano-technology business Sheet resistance |
| Zdroj: | Applied Physics Letters. 108:163302 |
| ISSN: | 1077-3118 0003-6951 |
| Popis: | We measure basic network parameters of silver nanowire (AgNW) networks commonly used as transparent conducting electrodes in organic optoelectronic devices. By means of four point probing with nanoprobes, the wire-to-wire junction resistance and the resistance of single nanowires are measured. The resistance RNW of a single nanowire shows a value of RNW=(4.96±0.18) Ω/μm. The junction resistance RJ differs for annealed and non-annealed NW networks, exhibiting values of RJ=(25.2±1.9) Ω (annealed) and RJ=(529±239) Ω (non-annealed), respectively. Our simulation achieves a good agreement between the measured network parameters and the sheet resistance RS of the entire network. Extrapolating RJ to zero, our study show that we are close to the electrical limit of the conductivity of our AgNW system: We obtain a possible RS reduction by only ≈20% (common RS≈10 Ω/sq). Therefore, we expect further performance improvements in AgNW systems mainly by increasing NW length or by utilizing novel network geometries. |
| Databáze: | OpenAIRE |
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