Structural characterization of the (AgCu)(InGa)Se2 thin film alloy system for solar cells
| Autor: | Brian E. McCandless, Gregory M. Hanket, William N. Shafarman, J.H. Boyle |
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| Rok vydání: | 2011 |
| Předmět: |
Chemistry
Alloy Metals and Alloys chemistry.chemical_element Surfaces and Interfaces Crystal structure engineering.material Evaporation (deposition) Surfaces Coatings and Films Electronic Optical and Magnetic Materials Crystallography Lattice constant Phase (matter) X-ray crystallography Materials Chemistry engineering Gallium Thin film |
| Zdroj: | Thin Solid Films. 519:7292-7295 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/j.tsf.2011.01.138 |
| Popis: | A detailed structural analysis of the (AgCu)(InGa)Se 2 thin film alloy system was undertaken via X-ray diffraction in order to determine its phase behavior and the chalcopyrite phase lattice constants of the alloy system. Thin films were grown by elemental co-evaporation with time-invariant flux, for the compositions 0 ≤ [Ag]/([Cu] + [Ag]) ≤ 1 for fixed [Ga]/([In] + [Ga]) = 0.5. Lattice constants were determined from the diffraction patterns by the Cohen method and were found to deviate from Vegard's rule. While films were predominantly single-phase, minor secondary phase reflections were observed for films with [Ag]/([Cu] + [Ag]) ≥ 0.5. However, this secondary phase behavior is not consistent with chalcopyrite–chalcopyrite phase segregation in earlier reports. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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