Autor: |
Simon S. Ang, D. Mannath, Sumeer Bhatara, I. Syllaios, M. Attaluri, Zahir Parkar, V. Montano-Martinez |
Rok vydání: |
2010 |
Předmět: |
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Zdroj: |
2010 IEEE Dallas Circuits and Systems Workshop. |
Popis: |
This paper describes the methodology used to replace a conventional FM SNR test on a 65nm Texas Instruments radio with a similar test implemented as a Built-in Self Test (BiST). A traditional R square approach was used for the correlation. Data from various changes that affected/improved the correlation is presented. This approach resulted in test cost savings of around 40%. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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