A reduced-cost Built-in Self Test for an FM receiver

Autor: Simon S. Ang, D. Mannath, Sumeer Bhatara, I. Syllaios, M. Attaluri, Zahir Parkar, V. Montano-Martinez
Rok vydání: 2010
Předmět:
Zdroj: 2010 IEEE Dallas Circuits and Systems Workshop.
Popis: This paper describes the methodology used to replace a conventional FM SNR test on a 65nm Texas Instruments radio with a similar test implemented as a Built-in Self Test (BiST). A traditional R square approach was used for the correlation. Data from various changes that affected/improved the correlation is presented. This approach resulted in test cost savings of around 40%.
Databáze: OpenAIRE