Improving the efficiency of PUF-based key generation in FPGAs using variation-aware placement
| Autor: | Shrikant Vyas, Naveen Kumar Dumpala, Russell Tessier, Daniel Holcomb |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Key generation
Computer science business.industry Reliability (computer networking) Cryptography 02 engineering and technology Encryption 020202 computer hardware & architecture ComputingMilieux_MANAGEMENTOFCOMPUTINGANDINFORMATIONSYSTEMS Embedded system 0202 electrical engineering electronic engineering information engineering Bit error rate 020201 artificial intelligence & image processing business Field-programmable gate array Error detection and correction BCH code |
| Zdroj: | FPL |
| DOI: | 10.1109/fpl.2016.7577307 |
| Popis: | Reconfigurable systems often require secret keys to encrypt and decrypt data. Applications requiring high security commonly generate keys based on physical unclonable functions (PUFs), circuits which use random manufacturing variations to produce secret keys that are unique to each device. The security of PUF-based keys comes at a high hardware cost. Due to the need for error correction to extract reliable keys from noisy PUFs, the total cost of an n-bit key far exceeds just the cost of producing n bits of PUF output. In this work, we propose variation-aware intra-FPGA PUF placement to reduce the area cost of PUF-based keys on FPGAs. We show that placing PUF instances according to the random variations of each chip instance reduces the bit error rate of the PUFs and consequently greatly reduces the overall cost of key generation. The proposed variation-aware placement approach is applicable to any PUF-based system implemented in reconfigurable logic. We demonstrate our approach on a Xilinx Zynq-7000 Programmable SoC using FPGA-specific PUFs with code-offset error correction based on BCH codes. We quantify the effectiveness of our approach by comparing the implementation costs of the same system when using the default approach of variation-agnostic placement and our proposed variation-aware placement. It is shown that our approach reduces the area required for PUF and error-correction circuitry by about 50% while achieving equivalent reliability. |
| Databáze: | OpenAIRE |
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