Sensitivity degradation of X-ray diodes in 2 to 6 keV

Autor:	王亮平 Wang Liangping, 赵屹东 Zhao Yidong, 吕敏 Lü Min, 邱孟通 Qiu Mengtong, 吴坚 Wu Jian, 崔明启 Cui Mingqi, 郑雷 Zheng Lei, 吴刚 Wu Gang, 邱爱慈 Qiu Aici, 丛培天 Cong Peitian
Rok vydání:	2010
Předmět:	Materials science business.industry X-ray Optoelectronics Degradation (geology) Electrical and Electronic Engineering business Sensitivity (electronics) Atomic and Molecular Physics and Optics Diode
Zdroj:	High Power Laser and Particle Beams. 22:1285-1290
ISSN:	1001-4322
DOI:	10.3788/hplpb20102206.1285
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::cf88e34293b7f114bfe2c781ce978fef https://doi.org/10.3788/hplpb20102206.1285 Zobrazit plný text záznamu