Investigation of the diffusion processes during the waveguide fabrication by ion exchange in glass

Autor:	K. H. Giebler, F. Rauch, W. Wagner, C. Singer, N. Fabricius
Rok vydání:	1990
Zdroj:	Optical Society of America Annual Meeting.
DOI:	10.1364/oam.1990.mz4
Popis:	For exact modeling of integrated-optical devices by the beam-propagation method, for example, an accurate knowledge of the refractive index profile is necessary. Especially in the case of single-mode waveguides, optical measuring methods fail because their spatial resolution is too low.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::cf265dba2966b62488d163b9dbf5e2d4 https://doi.org/10.1364/oam.1990.mz4 Zobrazit plný text záznamu