Evaluation of p-Type Doping for (1,1,-2,0) Epitaxial Layers Grown on α-Cut (1,1,-2,0) 4H-SiC Substrates

Autor: Marcin Zielinski, Sylvie Contreras, Yves Monteil, Caroline Blanc, Veronique Soulière, Jean Camassel, Sandrine Juillaguet, C. Sartel
Rok vydání: 2005
Předmět:
Zdroj: Materials Science Forum. :117-120
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/msf.483-485.117
Popis: We report an experimental investigation of the residual (n-type) and intentional (p-type) doping level of epitaxial layers grown on a-cut 4H-SiC substrates. Using SIMS, C(V) measurements, low temperature photoluminescence and Hall effect investigations, we show that nitrogen incorporates 3 times more than usually found for surfaces. Conversely, aluminum incorporates 8 times less. Altogether, this is in excellent agreement with previous results from stepcontrolled epitaxy.
Databáze: OpenAIRE