Evaluation of p-Type Doping for (1,1,-2,0) Epitaxial Layers Grown on α-Cut (1,1,-2,0) 4H-SiC Substrates
Autor: | Marcin Zielinski, Sylvie Contreras, Yves Monteil, Caroline Blanc, Veronique Soulière, Jean Camassel, Sandrine Juillaguet, C. Sartel |
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Rok vydání: | 2005 |
Předmět: | |
Zdroj: | Materials Science Forum. :117-120 |
ISSN: | 1662-9752 |
DOI: | 10.4028/www.scientific.net/msf.483-485.117 |
Popis: | We report an experimental investigation of the residual (n-type) and intentional (p-type) doping level of epitaxial layers grown on a-cut 4H-SiC substrates. Using SIMS, C(V) measurements, low temperature photoluminescence and Hall effect investigations, we show that nitrogen incorporates 3 times more than usually found for surfaces. Conversely, aluminum incorporates 8 times less. Altogether, this is in excellent agreement with previous results from stepcontrolled epitaxy. |
Databáze: | OpenAIRE |
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