SIMS accurate determination of matrix composition of topological crystalline insulator material Pb1 − xSnxSe

Autor:	Piotr Dziawa, Rafal Jakiela, Marta Galicka, Adam Barcz, Gunther Springholz
Rok vydání:	2019
Předmět:	Matrix composition Materials science Condensed matter physics Topological insulator Materials Chemistry Surfaces and Interfaces General Chemistry Insulator (genetics) Condensed Matter Physics Surfaces Coatings and Films
Zdroj:	Surface and Interface Analysis. 52:71-75
ISSN:	1096-9918 0142-2421
DOI:	10.1002/sia.6705
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ce9fc7435f4cdb0f4e2332a4fac75b31 https://doi.org/10.1002/sia.6705 Zobrazit plný text záznamu Plný text