A New Family of Sequential Elements With Built-in Soft Error Tolerance for Dual-VDD Systems
| Autor: | Rong Luo, Huazhong Yang, Saihua Lin |
|---|---|
| Rok vydání: | 2008 |
| Předmět: |
Engineering
business.industry Transistor Fault tolerance Hardware_PERFORMANCEANDRELIABILITY Logic level law.invention Soft error Hardware and Architecture Single event upset law Hardware_INTEGRATEDCIRCUITS Electronic engineering Redundancy (engineering) Hardware_ARITHMETICANDLOGICSTRUCTURES Electrical and Electronic Engineering business Software Flip-flop Hardware_LOGICDESIGN Leakage (electronics) |
| Zdroj: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 16:1372-1384 |
| ISSN: | 1063-8210 |
| DOI: | 10.1109/tvlsi.2008.2000520 |
| Popis: | In this paper, we propose some soft-error-tolerant latches and flip-flops that can be used in dual-VDD systems. By utilizing local redundancy and inner feedback techniques, the latches and flip-flops can recover from soft errors caused by cosmic rays and particle strikes. The proposed flip-flop can be used as a level shifter without the problems of static leakage and redundant switching activity. Implemented in a standard 0.18- mum technology, the proposed latches and flip-flops show superior performance compared to conventional ones in terms of delay and power while keeping the soft-error-tolerant characteristic. Experimental results show that compared to the traditional built-in soft-error-tolerant D latch, the D-QN delay of the new D latch is 29.1% less than that of the traditional built-in soft-error-tolerant D latch while consuming 16.5% less power as well. The D-Q delay and power of the new flip-flop are about 47.7% and 54% less than those of the traditional high speed level-converting flip-flop, respectively. In addition, the proposed flip-flop is more robust to soft errors. The critical charge which represents the minimum charge at the D input required to cause an error of the flip-flop can be increased by more than 46.4%. The time window during which the flip-flop will be erroneous caused by single-event upsets at the D input is reduced by more than 22.2%. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|