Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method
| Autor: | 李国龙 Li Guolong, 高忙忙 Gao Mangmang, 王立惠 Wang Lihui, 何力军 He Lijun, 李海波 Li Haibo, 钟景明 Zhong Jingming, 李进 Li Jin |
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| Rok vydání: | 2016 |
| Předmět: |
Materials science
business.industry 02 engineering and technology Polymer semiconductor 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Reflectivity Atomic and Molecular Physics and Optics 0104 chemical sciences Optics Electrical and Electronic Engineering Thin film 0210 nano-technology business |
| Zdroj: | Laser & Optoelectronics Progress. 53:043101 |
| ISSN: | 1006-4125 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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