A CMOS Lock-In Pixel Image Sensor With Multisimultaneous Gate for Time-Resolved Near-Infrared Spectroscopy

Autor:	De Xing Lioe, Yasuko Fukushi, Masashi Hakamata, Masatsugu Niwayama, Kamel Mars, Keita Yasutomi, Keiichiro Kagawa, Seiji Yamamoto, Shoji Kawahito
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Electron Devices. 70:1102-1108
ISSN:	1557-9646 0018-9383
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ce265a4df3fd70fe5148ccd1c2a251c8 https://doi.org/10.1109/ted.2023.3236591 Zobrazit plný text záznamu