Modified Ramped Current Stress Technique for Monitoring Thin Dielectrics Reliability and Charge Degradation

Autor:	Dmitrii V. Andreev, Vladimir M. Maslovsky, Vladimir V. Andreev, Alexander A. Stolyarov
Rok vydání:	2022
Předmět:	Materials Chemistry Surfaces and Interfaces Electrical and Electronic Engineering Condensed Matter Physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	physica status solidi (a). 219:2100400
ISSN:	1862-6319 1862-6300
DOI:	10.1002/pssa.202100400
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ce22294352a66e1a6838084e6aac5914 https://doi.org/10.1002/pssa.202100400 Zobrazit plný text záznamu Plný text