Domain Engineering for Enhanced Ferroelectric Properties of Epitaxial (001) BiFeO Thin Films

Autor: Ho Won Jang, Chad M. Folkman, Seung Hyub Baek, Yanbin Chen, Xiaoqing Pan, Rasmi R. Das, Ramamoorthy Ramesh, Padraic Shafer, C. T. Nelson, Chang-Beom Eom, Daniel Ortiz
Rok vydání: 2009
Předmět:
Zdroj: Advanced Materials. 21:817-823
ISSN: 1521-4095
0935-9648
Popis: Adv. Mater. 2009, 21, 817–823 2009 WILEY-VCH Verlag Gm Multiferroic BiFeO3 has attracted great interest due to its promising application tomagnetoelectric devices. In addition, the high remanent polarization and piezoelectric response of BiFeO3 thin films, which are comparable to those of conventional Ti-rich lead zirconia titanate, suggested BiFeO3 as a strong candidate for lead-free nonvolatile memories. BiFeO3 has a rhombohedral perovskite structure with pseudocubic lattice parameters ar1⁄4 3.96 A and ar1⁄4 0.68. Due to this low symmetry, (001)-oriented epitaxial BiFeO3 films possess the rhombohedral distortion along one of the four (111) crystallographic directions of the pseudocubic perovskite unit cell. Thus, eight possible polarization (ferroelectric) variants, which correspond to four structural (ferroelastic) domains, may form in the films, leading to complex domain patterns with both {100} and {101} twin boundaries. Such a complex domain structure can deteriorate the ferroelectric response of the system by external electric field, and complicates the examination of the coupling between magnetic and ferroelectric order parameters in BiFeO3. [3]
Databáze: OpenAIRE
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