Verification of the sputter-generated 32 SF n − ( n = 1–6) anions by accelerator mass spectrometry
| Autor: | R. G. Thomas, R.G. Mane, A.K. Gupta, S. Kailas, M. Hemalatha, P. Surendran, Sanjay Kumar, K. Mahata, M.L. Yadav, J.P. Nair |
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| Rok vydání: | 2016 |
| Předmět: |
Nuclear and High Energy Physics
010304 chemical physics Chemistry 010401 analytical chemistry Analytical chemistry 01 natural sciences Ion source 0104 chemical sciences Gas phase Secondary ion mass spectrometry Pelletron Sputtering 0103 physical sciences Instrumentation Ion sputtering Ultra sensitive Accelerator mass spectrometry |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 366:13-18 |
| ISSN: | 0168-583X |
| DOI: | 10.1016/j.nimb.2015.09.065 |
| Popis: | Recently, we have performed systematic Secondary Ion Mass Spectrometry (SIMS) measurements at our ion source test set up and have demonstrated that gas phase 32 SF n − ( n = 1–6) anions for all size ‘ n ’ can be readily generated from a variety of surfaces undergoing Cs + ion sputtering in the presence of high purity SF 6 gas by employing the gas spray-cesium sputter technique. In our SIMS measurements, the isotopic yield ratio 34 SF n − / 32 SF n − ( n = 1–6) was found to be close to its natural abundance but not for all size ‘ n ’. In order to gain further insight into the constituents of these molecular anions, ultra sensitive Accelerator Mass Spectrometry (AMS) measurements were conducted with the most abundant 32 SF n − ( n = 1–6) anions, at BARC-TIFR 14 UD Pelletron accelerator. The results from these measurements are discussed in this paper. |
| Databáze: | OpenAIRE |
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