| Autor: |
Xiang Wang, Zhi Zeng, Jianping Cheng, Ming Zeng, Baihui Yu, Ziran Zhao, Dufan Wu, Hengguan Yi, Wang Yongqiang, Xiaoguang Yue, Zhifei Luo |
| Rok vydání: |
2014 |
| Předmět: |
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| Zdroj: |
Journal of Instrumentation. 9:C11017-C11017 |
| ISSN: |
1748-0221 |
| DOI: |
10.1088/1748-0221/9/11/c11017 |
| Popis: |
Muon tomography is an advanced technology to non-destructively detect high atomic number materials. It exploits the multiple Coulomb scattering information of muon to reconstruct the scattering density image of the traversed object. Because of the statistics of muon scattering, the measurement error of system and the data incompleteness, the reconstruction is always accompanied with a certain level of interference, which will influence the reconstructed spatial resolution. While statistical noises can be reduced by extending the measuring time, system parameters determine the ultimate spatial resolution that one system can reach. In this paper, an effective frequency-domain model is proposed to analyze the reconstructed spatial resolution of muon tomography. The proposed method modifies the resolution analysis in conventional computed tomography (CT) to fit the different imaging mechanism in muon scattering tomography. The measured scattering information is described in frequency domain, then a relationship between the measurements and the original image is proposed in Fourier domain, which is named as "Muon Central Slice Theorem". Furthermore, a preliminary analytical expression of the ultimate reconstructed spatial is derived, and the simulations are performed for validation. While the method is able to predict the ultimate spatial resolution of a given system, it can also be utilized for the optimization of system design and construction. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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