REVIEW OF THE EFFECTS OF SURFACE TOPOGRAPHY, SURFACE CHEMISTRY, AND FLUID PHYSICS ON EVAPORATION AT THE CONTACT LINE

Autor:	Arya Chatterjee, Peter C. Wayner, Manas Ojha, Joel L. Plawsky
Rok vydání:	2008
Předmět:	Physics Microelectromechanical systems business.industry General Chemical Engineering Evaporation Nanotechnology General Chemistry Surface finish Microelectronics Surface modification Energy transformation Wetting Current (fluid) business
Zdroj:	Chemical Engineering Communications. 196:658-696
ISSN:	1563-5201 0098-6445
DOI:	10.1080/00986440802569679
Popis:	Liquid-vapor phase-change processes are becoming increasingly important in a wide variety of fields ranging from energy conversion, to microelectronics cooling, MEMs devices, and self-assembly. The phase change in these systems is governed by processes that occur at the contact line, where three phases meet. Evidence suggests that alterations of the surface chemistry and surface topography on the nanoscale can be used to dramatically enhance the phase-change process. This article reviews the current state of the art in nanoscale surface modification as applied to the enhancement of evaporative processes.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::cde50f0603221d93b380285f82014a15 https://doi.org/10.1080/00986440802569679 Zobrazit plný text záznamu