Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment

Autor:	Y. Xiong, A. Feeley, N. J. Pieper, D. R. Ball, B. Narasimham, J. Brockman, N. A. Dodds, S. A. Wender, S. -J. Wen, R. Fung, B. L. Bhuva
Rok vydání:	2022
Zdroj:	2022 IEEE International Reliability Physics Symposium (IRPS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::cd630db995b14852c62b70724e077dc9 https://doi.org/10.1109/irps48227.2022.9764523 Zobrazit plný text záznamu